VCSEL measurement system

 

Driven by the demand for mobile phone 3D sensing, automotive LiDAR and optical fiber transmission, the VCSEL component market has gradually grown. Using TEMPOint’s VCSEL LIV measurement system, users can quickly and accurately test the VCSEL performance (single point test, variable current , Variable temperature test).

Application field：

  • Face recognition
  • Gesture Recognition
  • Optical radar LiDAR
  • Time difference ranging ToF
  • Laser cutting

Features：

  • Minimum 0.2nm resolution
  • VCSEL dedicated spectrometer
  • 200 Khz high capture speed
  • Minimum 50us pulse width output
  • The instrument can do absolute value calibration in Taiwan
Measurement data
Peak radiant flux (W)      Average radiant flux (W)
Peak wavelength(nm)    Center wavelength(nm)    Center of gravity wavelength(nm)    Half width(nm)
Radiation voltage(V)     Current(A)     Power(W)     Radiation conversion efficiency
Radiant flux@ time domain        Spectral value
system requirement Suggested demand
Windows 7 32bit / 64bit or higher operating system
1 GB or more RAM
2 GB or more hard disk capacity		 Windows 7 32bit / 64bit or higher operating system
4 GB or more RAM
20 GB or more hard disk capacity
System specifications
model Spectrum LoMo For VCSEL
Integrating sphere
material Spectralon
Internal dimensions 5.3”( 13.5 cm )
Reflectivity > 98.5% ( 400 – 1500 nm )
> 95% ( 250 – 2500 nm )
Optical specifications
wavelength 800 – 990nm
Optical resolution 0.2 nm
Pixel interval 0.11 nm
Radiant flux range 10m-100w
Wavelength accuracy ± 0.1 nm
Wavelength reproducibility ± 0.2 nm
Detector capture speed 200 Khz
Detector linearity 99.5%
Detector accuracy ± 0.1%
Trace back NML or NIST
Other specifications
Digital interface USB 2.0
physical dimension 28.5 x 18 x 20 cm3
weight 2 kg
Power Specifications
Rated output 60V / 7.5A for Pulse / 500W
Minimum pulse width 50us
Current accuracy 0.04%+1mA (Low Range)
0.08%+5mA (High Range)

Note: Product specifications and descriptions in this document are subject to change without notice.

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UV LED measurement system

The efficiency of UV LED depends on the junction temperature. The thermal change of the PN junction will affect the optical power output and life expectancy of UV LED. Using TEMPOint’s UV LED measurement system, users can quickly and accurately test UV LED performance (single point test , Variable current, variable temperature test).

Application areas:

  • Germicidal ultraviolet (GUV)
  • UVC disinfection and purification
  • UV curing
  • Medical phototherapy
  • Analytical Instruments
  • Garden lighting

Features:

  • Absolute radiant flux (W) above 200nm can be measured
  • Data can be traced to JCSS or NIST
  • Optional power supply (programmable)
  • Temperature controller (programmable) is optional
  • The instrument can do absolute value calibration in Taiwan
Measurement data
X Y Z Color classification Specification classification
Lumen (Lumen)-photopic vision   Lumen`(Lumen)-dark vision
Radiant flux(W)   Photosynthetic photon flux(umol / Sec)   Infrared photon flux(umol/Sec)
 Chromaticity coordinates(x y u` v` v)   Correlated color temperature(K)  Duv Color purity(%)   Color tolerance (SDCM)
Dominant wavelength(nm)  Peak wavelength(nm)  Center wavelength(nm)  Centroid wavelength(nm)  Half-wavelength (nm)
Color rendering CRI R1 ~ R15 Color quality CQS Ver 9.0.3 Q1 ~ Q15
TM-30-15 – Rfh,1 ~ Rfh,16 Rf Rg Rf skin
Circadian factors external quantum efficiency
system requirement Suggested demand
Windows XP 32bit / 64bit or higher operating system
1 GB or more RAM
2 GB or more hard disk capacity		 Windows XP 32bit / 64bit or higher operating system
4 GB or more RAM
20 GB or more hard disk capacity
System specifications
model Spectrum LoMo For UV
Integrating sphere
material Spectralon
Internal dimensions 5.3”( 13.5 cm )
Reflectivity > 98.5% ( 400 – 1500 nm )
> 95% ( 250 – 2500 nm )
Calibration light source specifications
Types 150 W Xenon Lamp
wavelength 200 – 800 nm
Optical specifications
Radiant flux range 1m – 2000mw
Wavelength accuracy ± 0.3 nm
Wavelength reproducibility ± 0.2 nm
Optical resolution 1.5 nm
Trace back JCSS or NIST
Other specifications
Digital interface USB 2.0
physical dimension 28.5 x 18 x 20 cm3
weight 2 kg
Power Specifications
Rated output 30V / 5A / 150W
Set value resolution (voltage) 1 mV
Set value resolution (current) 0.1 mA
Set value accuracy (voltage) ±0.03% + 3mV
Set value accuracy (current) ±0.05% + 2.5mA

Note: Product specifications and descriptions in this document are subject to change without notice.

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Vpro Tempo VCSEL PROFILE TESTER

 

FAR FIELD PATTERN SYSTEM SPECIFICATION

Model No. RMK 30-VISSWIR RMK 200 RMK 400
Resolution 0.3M Pixels 640 x 512 Pixel 2.2M Pixels 2048 X 1088
Pixel		 4.2M Pixels 2048 X 2048
Pixel
Frame Per Second 60Hz 170 fps 90 fps
Pixel Size 10 um 5.5 um
A/D Converter 12 10 bit
Dynamic Range 60 dB 60 dB
Spectral Response 400 ~ 1700 nm 400 ~ 1000nm
Interface Camera Link USB 3.0
 F Number F / 8
Focus Length 65 mm
Panel Area Size 16 X 16 cm
working system Windows 10 is downward compatible to Windows XP
Support language Traditional Chinese / English
Memory capacity 512MB or more
Hard disk capacity 2 GB or more
monitor Resolution 1366 X 768 or higher
Office function Office XP or above must be installed
Software function
2D 3D XY distribution curve
Contour map
Multi-zone/multi-point uniformity calculation function
Customizable threshold ratio judgment
Contour curve distribution map
Calculate different percentages of wave width and divergence

 

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UV integrating sphere measuring system

SPECTRUM LOMO UV integrating sphere measurement system system characteristics

  1. Support spectrometer (customizable)
  2. Support power supply (customizable)
  3. Support thermostat (customizable)
  4. Standard lamp and absolute value correction
  5. Can measure continuously for a long time without interruption
  6. Data management function
  7. Make a formal report
Power supply model Itech 6132B
Rated output 30V / 5A
Load regulation rate (voltage) <0.01% + 2mV
Load regulation rate (current) <0.05% + 1.5mA
Set value resolution (voltage) 1 mV
Set value resolution (current) 0.1 mA
Resolution of readback value (voltage) 0.1 mV
Resolution of readback value (current) 0.01 mA
Set value accuracy (voltage) ±0.03% + 3mV
Set value accuracy (current) ±0.05% + 2.5mA
Readback accuracy (voltage) ±0.02% + 3mV
Readback accuracy (current) ±0.05% + 2.5mA
Ripple (voltage) <1mVrms/<4mVp-p
Ripple (current) < 4mArms
Size cm3 21.45 x 8.82 x 35.46
Weight kg 7

 

System specifications

Integrating sphere model Labsphere 53SL
Sphere diameter 13.5 cm
Outside diameter of sphere 15 cm
Ball weight 1Kg
Sphere color Labsphere blue
Sphere material Aluminum alloy
Ball coating material Spectralon
Coating reflectivity Up to 99%
SMA interface O
External opening (maximum) 5.08 cm
Detector port diameter 1.25cm
Number of detector ports 1 port
Maximum temperature resistance in the ball 400°C

 

Standard spectrometer specifications
model EE 2063
Detector style Back thinned CCD
CCD pixels 2048 X 64
Wavelength range 200 ~ 1100
Optical resolution (FWHM) 2.2 nm
Integration time 5 ~ 24000 msec
Cooling device Have
Wavelength accuracy < ± 0.5 nm
Stray light < 0.45%*
Measurement dynamic range 2d 18h 40m 1s
Digital conversion 16 bit
Digital interface USB 2.0

 

LED Measurement data

  • X Y Z
  • Lumen-photopic vision, luminous flux `(Lumen)-dark vision
  • Radiant flux (W), PPF (umol / Sec)
  • Angular coordinates (x y u` v` v), correlated color temperature (K), Duv, color purity (%), color tolerance (SDCM)
  • Dominant wavelength (nm), peak wavelength (nm), center wavelength (nm), centroid wavelength (nm), half-wave width (nm)
  • Color rendering CRI, R1 ~ R15
  • Color quality CQS Ver 9.0.3 Q1 ~ Q15
  • TM-30-15 – Rfh,1 ~ Rfh,16 TM-30-Rf TM-30-Rg

Correction data management function

Spectrum LoMo provides correction data & correction data management functions, which can reduce the number of auxiliary lamp corrections in frequent tests, and allows users to manage correction data & correction data through file management.

Each set of files contains calibration data, calibration environmental reference data, and sample modification data. If there are measurement problems, it can help users and original engineers to quickly troubleshoot.

 

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